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GDAT-A介电常数/介质损耗测试仪
介电常数/介质损耗测试仪
参考价 面议
具体成交价以合同协议为准
  • 型号 GDAT-A
  • 品牌
  • 厂商性质 生产商
  • 所在地 北京市

更新时间:2015-11-03 17:31:00浏览次数:366

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【简单介绍】
介电常数/介质损耗测试仪是根据GB/T 1409《测量电气绝缘材料在工频、音频、高频(包括米波波长在内)下电容率和介质损耗因数的试验方法》(等效采用IEC 60250)设计和制造的,并符合JB 7770等试验方法。它适用于在高频(1MHz)下绝缘材料的测试。
【详细说明】

介电常数/介质损耗测试仪GDAT-B

介电常数及介质损耗测试仪读书清晰,无须换算,操作简便,特别适合电子元器件的质量分析,品质控制,科研生产,也可用于高校的电子信息,电子通信,材料科学等专业作科研实验仪器.

介电常数/介质损耗测试仪特点:
◆ 优化的测试电路设计使残值更小
◆ 高频信号采用数码调谐器和频率锁定技术
◆ LED 数字读出品质因数,手动/自动量程切换
◆ 自动扫描被测件谐振点,标频单键设置和锁定,大大提高测试速度

         

     

GDAT-B

频率范围

10kHz50MHz

频率分段

(虚拟)

1099.9999kHz

100999.999kHz

19.99999MHz

1060MHz      

频率指示误差

3×10-5±1个字


作为一代的通用、多用途、多量程的阻抗测试仪器,测试频率上限达到目前高的160MHz。

1 双扫描技术 - 测试频率和调谐电容的双扫描、自动调谐搜索功能。

2 双测试要素输入 - 测试频率及调谐电容值皆可通过数字按键输入。

3 双数码化调谐 - 数码化频率调谐,数码化电容调谐。

4 自动化测量技术 -对测试件实施 Q 值、谐振点频率和电容的自动测量。

5 全参数液晶显示 – 数字显示主调电容、电感、 Q 值、信号源频率、谐振指针。

6 DDS 数字直接合成的信号源 -确保信源的高葆真,频率的高精确、幅度的高稳定。

7 计算机自动修正技术和测试回路*化 —使测试回路 残余电感减至zui低,** Q 读数值在不同频率时要加以修正的困惑。

标准配置:
高配Q表 一只  
试验电极  一只 (c类)
电感      一套(9只)
电源线    一条
说明书    一份
合格证    一份
保修卡    一份


使用方法:

高频Q表是多用途的阻抗测量仪器,为了提高测量精度,除了使Q表测试回路本身残余参量尽可能地小,使耦合回路的频响尽可能地好之外,还要掌握正确的测试方法和残余参数修正方法。

1.测试注意事项

a.本仪器应水平安放;

b.如果你需要较精确地测量,请接通电源后,预热30分钟;

c.调节主调电容或主调电容数码开关时,当接近谐振点时请缓调;

d.被测件和测试电路接线柱间的接线应尽量短,足够粗,并应接触良好、可靠,以减少因接线的电阻和分布参数所带来的测量误差;

e.被测件不要直接搁在面板顶部,离顶部一公分以上,必要时可用低损耗的绝缘材料如聚苯乙烯等做成的衬垫物衬垫;

f.手不得靠近试件,以免人体感应影响造成测量误差,有屏蔽的试件,屏蔽罩应连接在低电位端的接线柱。

2.高频线圈的Q值测量(基本测量法)


Characteristic
The design of test circuit optimization so that the residual smaller
The high frequency signal by digital tuner and frequency locking technique
The LED digital readout quality factor, manual / automatic range switching
Auto scan the measured resonance frequency standard, single set and lock, greatly improve the test speed
Item
GDAT-B
Frequency range
10kHz ~ 50MHz
Frequency segmentation
(virtual)
10 ~ 99.9999kHz
100 ~ 999.999kHz
1 ~ 9.99999MHz
10 ~ 60MHz
Frequency indicating error
3 * 10-5 + 1 words
As the latest generation of general, multi-purpose, multi - range impedance test instrument, the test frequency limit to reach the highest 160MHz.
Double scanning, automatic tuning and searching function of 1 double scanning technology - testing frequency and tuning capacitor.
2 the input of the two test elements - the test frequency and the tuning capacitor value can be input by the digital key.
3 double digital tuning - digital frequency tuning, digital tuning capacitor.
4 automatic measurement technology - automatic measurement of the Q value of the test piece, the frequency and the capacitance of the resonant frequency.
5 the parameters of liquid crystal display, digital display, Q main capacitor, inductance value, signal source frequency, resonant pointer.
6 DDS direct digital synthesis signal source to ensure high Baozhen source, high stability and high precision, amplitude and frequency of the.
7 computer automatic correction technology and testing circuit optimization - the test circuit residual inductance to the lowest, the total eradication of Q read the value at different frequencies to be corrected by the confusion.
Standard configuration:
A table with Q
Test electrode (c)
Inductance one set (9)
Power cord
Instruction manual
Certificate of conformity
Warranty card
Using method
High frequency Q table is multi-purpose impedance measurement instrument, in order to improve the measurement accuracy, in addition to the Q table test loop itself residual parameters as much as possible, so that the frequency response of the coupling loop is as good as possible, but also master the correct test method and residual parameter correction method.
1 test note
A. the instrument should be placed horizontally;
B. If you need a more accurate measurement, please put on the power supply, preheat 30 minutes;
C. regulates the main capacitor or main capacitor digital switch, when close to the resonant point please slow tune;
The D. is the connection between the test piece and the test circuit wiring should be as short as possible, thick enough, and should be in contact with good, reliable, in order to reduce the resistance and the distribution parameters caused by the measurement error;
E. is not directly placed on the top of the panel, the top of the top of a centimeter above, when necessary, the use of low loss of insulation materials such as polystyrene, etc.;
F. hand shall not be close to the test piece, lest the human body sensor affect the measurement error, and there is a shield of the test piece, and the shield cover should be connected to the terminal of the low potential.
2 high frequency Q measurement (basic measurement method)



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